X-ray diffraction analysis (XRD)

Exemplary analysis conditions: Equipment: Bruker D8 Advance diffractometer;   Mode: Symmetrical reflection with Cu Ka radiation;   Wavelength: λ=1.5406Å;   Optics: Göbel Mirror bent gradient multilayer optics;   Detector: Våntec-1;   Angular range: 3° to 50° in steps of 0.01°;    Target: Cu;   Filter: Ni;   Voltage: 40 kV;   Current: 40 mA;   Measuring time: 0.1 s/steps

Exemplary XRD-spectrum of a test item

A table of 2-Theta° values can be derived from the spectrum and compared to reference spectrum or to database. Whereas the absolute signal intensity depends on the recording conditions, the similarity of the signal pattern in 2-Theta°-positions allows to prove the identity of two compounds.

XRD analysis is performed as a non-GLP service.